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采用X射线衍射确定薄膜物相。Phase identification is performed by X-ray diffractometry.

利用X射线粉晶衍射仪对不同产地的萤石矿物药进行全谱扫描。Fluorite mineral medicines from different origins were analyzed by X-ray power diffractometry.

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差热分析和X射线粉末衍射证实药物以分子状态分散于载体中。The DTA and X ray powder diffractometry showed that 1 molecules were dispersed in the solid dispersion.

用高分辨X射线衍射术对自发应变及铁弹畴结构进行了研究。The spontaneous strains and ferroelastic domain structures have been investigated by high resolution X ray diffractometry.

产物的结构通过红外光谱、核磁共振氢谱、元素分析和单晶X射线衍射确定。The structures of all compounds obtained were characterized by IR, 1H NMR spectra, elemental analysis and single crystal X-ray diffractometry.

介绍了用X射线双晶及三晶衍射仪检验半导体晶片研磨及抛光损伤的原理及方法。Methods using X-ray double-and triple-crystal diffractometry for the investigation of lapping and polishing damages in single crystal wafers have been suggested.

本文应用扫描电镜、X-光衍射和偏光显微等现代分析技术,观察和研究了不同取代度羟丙基淀粉和原淀粉的颗粒形貌及其结晶结构。The changes of granular appearance and crystal structure of starch after being kneaded were investigated by SEM, polarization microscope and X-ray diffractometry.

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对具有大层间距的累托石-尼龙夹层复合材料和具有长周期有序排列的脂质材料等进行了小角度X射线衍射分析。Rectorite-nylon sandwich composites with large layer-spacing and lipid materials with long-period ordered structure were studied by small angle X-ray diffractometry.

文章综述了粉晶X射线衍射法在造岩矿物、黏土矿物、岩组学、类质同象和结晶度的测定等领域发挥的重要作用。Total and section spectra scanning for component analysis in the metal plates and their phosphide covering membranes were carried out using X-ray powder diffractometry.

用差式扫描量热分析、X射线衍射和扫描电镜等技术研究SAZ系非晶的原位受控晶化过程。The crystallization behaviors of SAZ amorphous bulk materials were investigated by differential scanning calorimetry, X-ray diffractometry and scanning electron microscopy.

原料聚丙烯腈粉末、静电纺纳米纤维、预氧化后纳米纤维和炭化后纳米纤维的内部结构变化采用X射线衍射和红外光谱法进行分析。Characterization of the microstructure of PAN powder, electrospun nanofibers, preoxidized nanofibers and carbon nanofibers was performed by X-ray diffractometry and infrared spectroscopy.